A sintered silicon nitride (Si3N4) ceramic atomic force microscope (AFM) tip (AFM) tip (cross-sectional area pi/4 x 5x10^(-9))m^2 rasters across a material's surface with a speed of 10^(-8) and crashes into the surface of a 1x10^(-9) m particle.

A) Sketch the stress v strain behavior of sintered silicon nitride. Label modules of elasticity (E), yield stress (YS), the ultimate compressive strength (UCS), and the rupture stress (RS).

B) Calculate the kinetic energy with which the tip crashed into the material's surface.

C) Determine the amount of energy or work that the silicon nitride tip could absorb before being plastically deformed, assuming no initial cracks. Volume is in part A.

D) Determine the amount of energy (or work) that the AFM tip could absorb before being fractured, assuming no initial cracks.

E) Because of the small dimensions in this problem, you are concerned that a 1x10^(-9) crack in the Si3N4 AFM tip would be quite problematic. Calculate the maximum stress that could be placed on the pre-cracked Si3N4 AFM tip. Compare the stress you calculate in part E with what you looked up in part A and tell whether the crack in the tip lowered the stress that could be put on the tip.

F) Calculate the shear modulus G for the sintered silicon nitride AFM tip.